| Test Programs | ||
|---|---|---|
 | Chapter 302. STM3210E-EVAL Platform HAL |  |
Name
Test Programs — Details
Test Programs
The STM3210E platform HAL contains some test programs which allow various aspects of the board to be tested.
ADC Test
This program tests the ADC driver for the STM32. The only device
connected to the ADC on the board is the potentiometer connected
to ADC1 logical channel 14. Therefore this test primarily tests
that. However, in addition it also report the values of the
temperature sensor and Vrefint inputs that are sourced
on-chip. The option
CYGBLD_HAL_CORTEXM_STM3210E_EVAL_TEST_ADC must
be enabled to run this test since it needs human interaction.
SPI flash test
This program tests the MPC25Pxx serial flash connected to SPI bus
1. It erases, programs and reads a number of sectors in the
flash, and should therefore not be run if the flash contains data
that should be retained. The CYGPKG_IO_FLASH
package must be present
and CYGHWR_HAL_CORTEXM_STM32_FLASH_M25PXX
enabled to allow this test to be built.
I²C Test
This program tests the I²C driver for the STM32. The only
device connected to I²C on the board is the STLM75
temperature sensor on I2C1. The option
CYGBLD_HAL_CORTEXM_STM3210E_EVAL_TEST_STLM75 must
be enabled to run this test.
NAND ECC walk test
This program is an adapted version of the sweccwalk
test in the NAND Flash library which tests the hardware ECC support
provided by the on-chip FSMC. It does not affect any data currently
stored on the on-board NAND flash chip.
| |  | |
| The HAL Port |  | Chapter 303. STM32X0G-EVAL Platform HAL |
| 2024-12-10 | eCosPro Non-Commercial Public License |