| Test Programs | ||
|---|---|---|
 | Chapter 301. STM3210C-EVAL Platform HAL |  |
Name
Test Programs — Details
Test Programs
The STM3210C platform HAL contains some test programs which allow various aspects of the board to be tested.
ADC test
This program tests the ADC driver for the STM32. The only device
connected to the ADC on the board is the potentiometer connected
to ADC1 logical channel 14. Therefore this test primarily tests
that. However, in addition it also report the values of the
temperature sensor and Vrefint inputs that are sourced
on-chip. The option
CYGBLD_HAL_CORTEXM_STM3210C_EVAL_TEST_ADC must
be enabled to run this test since it needs human interaction.
M24C64 I²C serial EEPROM test
This program tests I²C access to the on-board M24C64 serial EEPROM.
This test is only built if the CDL configuration option
CYGPKG_HAL_CORTEXM_STM32_STM3210C_EVAL_I2C is enabled.
The STM3210C-EVAL board prevents writes to the EEPROM unless jumper JP17
is closed. Therefore to allow this test to pass, ensure JP17 is fitted
with a jumper.
| |  | |
| The HAL Port |  | Chapter 302. STM3210E-EVAL Platform HAL |
| 2024-12-10 | eCosPro Non-Commercial Public License |